Recent advances in modern manufacturing techniques has made it possible to manufacture small and complex components to extremely high accuracies. In direct response to the extreme demands of quality assurance for the measurement of size, form and position of microsystem parts, extensive research is being carried out in the area of geometrical measurement on the micro-scale.
‘Microparts’ is a joint EURAMET research project in the area of micro co-ordinate metrology for miniature components. VSL, NPL, PTB and METAS are collaborating on the project in all aspects of micro CMM technology including the development of novel contact, optical and XCT probing techniques, machine calibration, stability, traceability and calibration artefacts. The workshop aims to disseminate the work of the project to the wider audience and discuss related research and development topics.
Topics include:
• Updates on the development of novel micro-CMM probes
• Development of micro-CMM platforms
• Calibration and traceability of micro-CMM platforms
• Integrated micro metrology and micro manufacturing techniques
Registration Register on the workshop webpages.
Programme
Wednesday 28th October 2009
11:00 - 11:10 Introduction to NPL – Prof. Richard Leach
11:10 - 11:30 Introduction to Microparts – Dr. Rob Bergmans
11:30 - 12:00 Dr. Jack Stone, NIST, USA – Fiber probe measurements in 2 and 3 dimensions
12:00 - 12:30 Dr. Alain Küng, Federal Office of Metrology METAS, Switzerland – Development and application of the METAS micro-CMM
12:30 - 13:00 Dr. Ulrich Neuschaefer-Rube, PTB, Germany – Dimensional measurements with micro-CT -
Test procedures and applications
13:00 - 14:00 Lunch
14:00 - 14:30 Prof. Richard Leach, NPL, United Kingdom – Development of a 3D vibrating micro-CMM probe using an active triskelion flexure
14:30 - 15:00 Dr. Rob Bergmans, VSL, The Netherlands – Traceability of the F25 micro-CMM
15:00 - 15:30 Coffee
15:30 - close Laboratory tours of NPL
Thursday 29th October 2009
09:00 - 09:30 Ernst Treffers, Director Business Development, Xpress Precision Engineering, The Netherlands – Gannen series: 3D tactile probes for microparts
09:30 - 10:00 Dr. Walter Schott, Managing Director, SIOS Messtechnik – Precise measurements with nanomeasuring machine NMM 1
10:00 - 10:30 Dr. Ralf Christoph, President, Werth Messtechnik – Measuring microfeatures with dense pointclouds: Scanning with tomography, microprobes and laser
10:30 - 11:00 Coffee
11:00 - 11:30 Carl Zeiss – TBC
11:00 - 11:30 Dr. Marcin Bauza, InsituTec, USA – Single platform gauge head applied to microscale 3D surface profilometry and roundness
11:30 - 12:00 Dr. Henny Spaan, Director, IBS PE, The Netherlands – Isara 400: Large volume ultra-precision CMM
12:00 - 13:00 Lunch
13:00 - 13:30 Dr. Pawel Drabarek, Robert Bosch, Germany – Interferometrical stylus system with a miniature non contact fiber probe
13:30 - 14:00 Dr. Joel Segal, CECA Nottingham, United Kingdom – Integration aspects of micro metrology in micro manufacturing applications
For further information on:
Event adminstration - Stuart Humphreys
Technical content - James Claverley
You can download the workshop flyer below:
Attachment | Size |
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091028_microparts_flyer_20090612141343.pdf | 1.87 MB |